Our Capabilities

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Reticle Inspection

High-precision reticle inspection using advanced SDM-100xy systems with 0.152ฮผm particle detection.

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Wafer Inspection

Next-generation wafer scanning with 0.15ฮผm particle detection for advanced process nodes.

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KLA-Tencor Support

Comprehensive service, parts, and technical support for legacy and current KLA-Tencor tools since 1986.

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Field Service

On-site installation, calibration, maintenance, and repair services for inspection equipment.

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