Wafer Inspection Services, Inc.Precision Semiconductor Inspection Solutions
Welcome To Wafer Inspection Services, Inc.
Precision Inspection Solutions for the Semiconductor Industry
KLA-Tencor Tool Support since 1986. Specializing in reticle and wafer inspection equipment, parts, and service.
Our Equipment
Product Literature
Products & Services
SDM-100xy Reticle Scanner
0.152μm particle detection. Advanced reticle and wafer surface inspection system.
- 0.152μm particle detection
- Reticle and wafer capability
- High-throughput scanning
- KLA-Tencor compatible
New Wafer Scanners
0.15μm Particle Detection. Next-generation wafer inspection for advanced process nodes.
- 0.15μm particle detection
- Automated wafer handling
- Comprehensive reporting suite
- Factory automation ready
Interested in a demo or quote?
Contact our team for a free consultation on your inspection needs.
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